Surface and in-depth characterization of InGaN compounds...

Surface and in-depth characterization of InGaN compounds synthesized by plasma-assisted molecular beam epitaxy

Mirosław Krawczyk, Wojciech Lisowski, Janusz W. Sobczak, Andrzej Kosiński, Aleksander Jablonski, Czesław Skierbiszewski, Marcin Siekacz, Sylwia Wiązkowska
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Volume:
509
Year:
2011
Language:
english
DOI:
10.1016/j.jallcom.2011.07.052
File:
PDF, 515 KB
english, 2011
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