Interface characterization and atomic intermixing processes in Be/W bilayers deposited on Si(0 0 1) substrates with Fe buffer layers
V. Kuncser, P. Palade, G. Schinteie, S.G. Sandu, L. Trupina, G.A. Lungu, N.G. Gheorghe, C.M. Teodorescu, C. Porosnicu, I. Jepu, C.P. Lungu, G. FilotiVolume:
512
Year:
2012
Language:
english
DOI:
10.1016/j.jallcom.2011.09.063
File:
PDF, 1.33 MB
english, 2012