Critical thickness of contact melting in the Au/Ge layered film system
A.P. Kryshtal, R.V. Sukhov, A.A. MinenkovVolume:
512
Year:
2012
Language:
english
DOI:
10.1016/j.jallcom.2011.09.086
File:
PDF, 1.08 MB
english, 2012