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Stress and defect induced enhanced low field magnetoresistance and dielectric constant in La0.7Sr0.3MnO3 thin films
Sayani Majumdar, H. Huhtinen, H.S. Majumdar, P. PaturiVolume:
512
Year:
2012
Language:
english
DOI:
10.1016/j.jallcom.2011.09.093
File:
PDF, 1.37 MB
english, 2012