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The illustrated brief application of defect distribution model for heterojunction device by admittance spectroscopy
Gorkem Oylumluoglu, A. Sertap Kavasoglu, Nese KavasogluVolume:
523
Year:
2012
Language:
english
DOI:
10.1016/j.jallcom.2012.01.154
File:
PDF, 800 KB
english, 2012