High resolution transmission electron microscopy studies of...

High resolution transmission electron microscopy studies of σ phase in Ni-based single crystal superalloys

Fei Sun, Jianxin Zhang, Pan Liu, Qiang Feng, Xiaodong Han, Shengcheng Mao
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Volume:
536
Year:
2012
Language:
english
DOI:
10.1016/j.jallcom.2012.05.004
File:
PDF, 753 KB
english, 2012
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