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Growth and characterization of epitaxial Ti3GeC2 thin films on 4H-SiC(0001)
K. Buchholt, P. Eklund, J. Jensen, J. Lu, R. Ghandi, M. Domeij, C.M. Zetterling, G. Behan, H. Zhang, A. Lloyd Spetz, L. HultmanVolume:
343
Year:
2012
Language:
english
DOI:
10.1016/j.jcrysgro.2012.01.020
File:
PDF, 571 KB
english, 2012