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Optical and morphological study of misoriented GaAs substrates exposed to bismuth flow using in situ spectral reflectance and atomic force microscopy
I. Massoudi, M.M. Habchi, A. Rebey, B. El JaniVolume:
353
Year:
2012
Language:
english
DOI:
10.1016/j.jcrysgro.2012.05.010
File:
PDF, 641 KB
english, 2012