Assessment of early attrition using an ordinary flatbed scanner
Arie van’t Spijker, Cees M. Kreulen, Ewald M. Bronkhorst, Nico H.J. CreugersVolume:
40
Year:
2012
Language:
english
DOI:
10.1016/j.jdent.2012.04.002
File:
PDF, 535 KB
english, 2012