Relative-thickness dependence of exchange bias in bilayers...

Journal of Magnetism and Magnetic Materials 2012 Vol. 324; Iss. 19

Relative-thickness dependence of exchange bias in bilayers and trilayers

Yong Hu, Guo-Zhen Wu, Yan Liu, An Du
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Volume:
324
Year:
2012
Language:
english
DOI:
10.1016/j.jmmm.2012.05.040
File:
PDF, 845 KB
english, 2012
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