Investigation of nc-Si inclusions in multilayer a-Si:H films obtained using the layer by layer technique
A.S. Gudovskikh, J.P. Kleider, V.P. Afanasjev, A.Z. Kazak-Kazakevich, A.P. SazanovVolume:
338-340
Year:
2004
Language:
english
DOI:
10.1016/j.jnoncrysol.2004.02.038
File:
PDF, 320 KB
english, 2004