![](/img/cover-not-exists.png)
Model of electronic transport in microcrystalline silicon and its use for prediction of device performance
A. Fejfar, T. Mates, O. Čertı́k, B. Rezek, J. Stuchlı́k, I. Pelant, J. KočkaVolume:
338-340
Year:
2004
Language:
english
DOI:
10.1016/j.jnoncrysol.2004.02.063
File:
PDF, 764 KB
english, 2004