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Characterization of mixed phase silicon by Raman spectroscopy
M. Ledinský, L. Fekete, J. Stuchlík, T. Mates, A. Fejfar, J. KočkaVolume:
352
Year:
2006
Language:
english
DOI:
10.1016/j.jnoncrysol.2005.10.072
File:
PDF, 237 KB
english, 2006