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Characterization of the protocrystalline silicon multilayer
Seong Won Kwon, Joonghwan Kwak, Seung Yeop Myong, Koeng Su LimVolume:
352
Year:
2006
Language:
english
DOI:
10.1016/j.jnoncrysol.2005.12.016
File:
PDF, 146 KB
english, 2006