![](/img/cover-not-exists.png)
Silicon light emissions from boron implant-induced defect engineering
G.Z. Pan, R.P. Ostroumov, L.P. Ren, Y.G. Lian, K.L. WangVolume:
352
Year:
2006
Language:
english
DOI:
10.1016/j.jnoncrysol.2006.02.083
File:
PDF, 266 KB
english, 2006