Carrier dynamics in microcrystalline silicon studied by...

Carrier dynamics in microcrystalline silicon studied by time-resolved terahertz spectroscopy

L. Fekete, H. Němec, F. Kadlec, P. Kužel, J. Stuchlı´k, A. Fejfar, J. Kočka
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Volume:
352
Year:
2006
Language:
english
DOI:
10.1016/j.jnoncrysol.2006.02.099
File:
PDF, 133 KB
english, 2006
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