Short-range atomic order in the surface layer of sputter-deposited Al0.6W0.4 thin film investigated using directional elastic peak electron spectroscopy
Ł. Rok, S. Mróz, E. Zych, M. Janik-CzachorVolume:
352
Year:
2006
Language:
english
DOI:
10.1016/j.jnoncrysol.2006.03.057
File:
PDF, 196 KB
english, 2006