Examination of local structure of composite and low dimension semiconductor with X-ray absorption spectroscopy
K. Lawniczak-Jablonska, I.N. Demchenko, E. Piskorska, A. Wolska, E. Talik, D.N. Zakharov, Z. Liliental-WeberVolume:
352
Year:
2006
Language:
english
DOI:
10.1016/j.jnoncrysol.2006.07.012
File:
PDF, 993 KB
english, 2006