Study on the device characteristics of FePc and FePcCl organic thin film Schottky diodes: Influence of oxygen and post deposition annealing
K.R. Rajesh, C.S. MenonVolume:
353
Year:
2007
Language:
english
DOI:
10.1016/j.jnoncrysol.2006.12.016
File:
PDF, 217 KB
english, 2007