Processing effects on the stability of amorphous indium...

Journal of Non-Crystalline Solids 2008 Vol. 354; Iss. 19-25

Processing effects on the stability of amorphous indium gallium zinc oxide thin-film transistors

Hai Q. Chiang, Brian R. McFarlane, David Hong, Rick E. Presley, John F. Wager
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Volume:
354
Year:
2008
Language:
english
DOI:
10.1016/j.jnoncrysol.2007.10.105
File:
PDF, 174 KB
english, 2008
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