Defect configurations in Ge–S chalcogenide glasses studied...

Defect configurations in Ge–S chalcogenide glasses studied by Raman scattering and positron annihilation technique

Changgui Lin, Haizheng Tao, Zhu Wang, Bing Wang, Haochun Zang, Xiaolin Zheng, Xiujian Zhao
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Volume:
355
Year:
2009
Language:
english
DOI:
10.1016/j.jnoncrysol.2009.01.004
File:
PDF, 270 KB
english, 2009
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