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Dissolution of thin SiO2-coatings – Characterization and evaluation
M. Klause, U. Rothhaar, M. Bicker, W. OhlingVolume:
356
Year:
2010
Language:
english
DOI:
10.1016/j.jnoncrysol.2009.11.003
File:
PDF, 466 KB
english, 2010