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Fatigue Testing of Controlled Memory Wire Nickel-Titanium Rotary Instruments
Ya Shen, Wei Qian, Houman Abtin, Yuan Gao, Markus HaapasaloVolume:
37
Year:
2011
Language:
english
DOI:
10.1016/j.joen.2011.03.023
File:
PDF, 463 KB
english, 2011