Detecting particles in cryo-EM micrographs using learned...

Detecting particles in cryo-EM micrographs using learned features

Satya P Mallick, Yuanxin Zhu, David Kriegman
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Volume:
145
Year:
2004
Language:
english
DOI:
10.1016/j.jsb.2003.11.005
File:
PDF, 514 KB
english, 2004
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