Fast automatic particle picking from cryo-electron...

Fast automatic particle picking from cryo-electron micrographs using a locally normalized cross-correlation function: a case study

B.K Rath, J Frank
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Volume:
145
Year:
2004
Language:
english
DOI:
10.1016/j.jsb.2003.11.015
File:
PDF, 403 KB
english, 2004
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