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Image segmentation for automatic particle identification in electron micrographs based on hidden Markov random field models and expectation maximization
Vivek Singh, Dan C Marinescu, Timothy S BakerVolume:
145
Year:
2004
Language:
english
DOI:
10.1016/j.jsb.2003.11.028
File:
PDF, 1.59 MB
english, 2004