Tilt-series and electron microscope alignment for the...

Tilt-series and electron microscope alignment for the correction of the non-perpendicularity of beam and tilt-axis

Daniel Castaño Díez, Anja Seybert, Achilleas S. Frangakis
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Volume:
154
Year:
2006
Language:
english
DOI:
10.1016/j.jsb.2005.12.009
File:
PDF, 660 KB
english, 2006
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