Automatic particle selection from electron micrographs...

Automatic particle selection from electron micrographs using machine learning techniques

C.O.S. Sorzano, E. Recarte, M. Alcorlo, J.R. Bilbao-Castro, C. San-Martín, R. Marabini, J.M. Carazo
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Volume:
167
Year:
2009
Language:
english
DOI:
10.1016/j.jsb.2009.06.011
File:
PDF, 717 KB
english, 2009
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