Automatic particle selection from electron micrographs using machine learning techniques
C.O.S. Sorzano, E. Recarte, M. Alcorlo, J.R. Bilbao-Castro, C. San-Martín, R. Marabini, J.M. CarazoVolume:
167
Year:
2009
Language:
english
DOI:
10.1016/j.jsb.2009.06.011
File:
PDF, 717 KB
english, 2009