Reference-free particle selection enhanced with...

Reference-free particle selection enhanced with semi-supervised machine learning for cryo-electron microscopy

Robert Langlois, Jesper Pallesen, Joachim Frank
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Volume:
175
Year:
2011
Language:
english
DOI:
10.1016/j.jsb.2011.06.004
File:
PDF, 1.17 MB
english, 2011
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