Thermal modeling and measurements of AlGaN/GaN HEMTs...

Microelectronics Journal 2012 Vol. 43; Iss. 9

Thermal modeling and measurements of AlGaN/GaN HEMTs including thermal boundary resistance

R. Sommet, G. Mouginot, R. Quere, Z. Ouarch, M. Camiade
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Volume:
43
Year:
2012
Language:
english
DOI:
10.1016/j.mejo.2011.07.009
File:
PDF, 2.13 MB
english, 2012
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