Approaches for ultrafast imaging of transient materials...

Micron 2012 Vol. 43; Iss. 11

Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope

Thomas LaGrange, Bryan W. Reed, Melissa K. Santala, Joseph T. McKeown, Andreas Kulovits, Jörg M.K. Wiezorek, Liliya Nikolova, Federico Rosei, Bradely J. Siwick, Geoffrey H. Campbell
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Volume:
43
Year:
2012
Language:
english
DOI:
10.1016/j.micron.2012.04.010
File:
PDF, 3.07 MB
english, 2012
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