Effects of single vacancy defect position on the stability...

Microelectronics Reliability 2012 Vol. 52; Iss. 7

Effects of single vacancy defect position on the stability of carbon nanotubes

R.H. Poelma, H. Sadeghian, S. Koh, G.Q. Zhang
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Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.03.015
File:
PDF, 1.00 MB
english, 2012
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