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300 mm Czochralski silicon wafers optimized with respect to voids with laterally homogeneous oxygen precipitation
G. Kissinger, G. Raming, R. Wahlich, T. MüllerVolume:
407
Year:
2012
Language:
english
DOI:
10.1016/j.physb.2011.08.055
File:
PDF, 286 KB
english, 2012