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Irradiation effects of 6 MeV electron on electrical properties of Al/Al2O3/n-Si MOS capacitors
P. Laha, I. Banerjee, A. Bajaj, P. Chakraborty, P.K. Barhai, S.S. Dahiwale, A.K. Das, V.N. Bhoraskar, D. Kim, S.K. MahapatraVolume:
81
Year:
2012
Language:
english
DOI:
10.1016/j.radphyschem.2012.04.006
File:
PDF, 454 KB
english, 2012