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Structure of V thin films on Al(100) using XPD, LEED, and LEIS
W. Priyantha, R. Droopad, M. Kopczyk, R.J. Smith, A. KayaniVolume:
606
Year:
2012
Language:
english
DOI:
10.1016/j.susc.2012.03.012
File:
PDF, 1.23 MB
english, 2012