Displacement Current Measurement as a Tool to Characterize...

Synthetic Metals 2005 Vol. 153; Iss. 1-3

Displacement Current Measurement as a Tool to Characterize Organic Field Effect Transistors

Satoshi Ogawa, Tatsuo Naijo, Yasuo Kimura, Hisao Ishii, Michio Niwano
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Volume:
153
Year:
2005
DOI:
10.1016/j.synthmet.2005.07.267
File:
PDF, 857 KB
2005
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