Modeling electrical characteristics of thin-film...

Modeling electrical characteristics of thin-film field-effect transistors: II: Effects of traps and impurities

P. Stallinga, H.L. Gomes
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
156
Year:
2006
Language:
english
DOI:
10.1016/j.synthmet.2006.09.008
File:
PDF, 970 KB
english, 2006
Conversion to is in progress
Conversion to is failed