Refractive index measurements of planar chalcogenide thin film
Jacques M Laniel, Jean-Michel Ménard, Karine Turcotte, Alain Villeneuve, Réal Vallée, Cédric Lopez, Kathleen A RichardsonVolume:
328
Year:
2003
Language:
english
DOI:
10.1016/s0022-3093(03)00527-1
File:
PDF, 198 KB
english, 2003