In situ characterization of the growing a-Si:H surface by...

In situ characterization of the growing a-Si:H surface by IR spectroscopy

Yasutake Toyoshima, Kazuo Arai, Akihisa Matsuda, Kazunobu Tanaka
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Volume:
137-138
Year:
1991
Language:
english
DOI:
10.1016/s0022-3093(05)80233-9
File:
PDF, 400 KB
english, 1991
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