Characterization of SiO2 films on glass substrate by sol-gel and vacuum deposition methods
Y. Katayama, E. Ando, T. KawaguchiVolume:
147-148
Year:
1992
Language:
english
DOI:
10.1016/s0022-3093(05)80654-4
File:
PDF, 293 KB
english, 1992