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Amorphous silicon X-ray detectors
M Hoheisel, M Arques, J Chabbal, C Chaussat, T Ducourant, G Hahm, H Horbaschek, R Schulz, M SpahnVolume:
227-230
Year:
1998
Language:
english
DOI:
10.1016/s0022-3093(98)00316-0
File:
PDF, 157 KB
english, 1998