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Stress induced leakage currents in N-MOSFETs submitted to channel hot carrier injections
D Goguenheim, A Bravaix, D Vuillaume, F Mondon, M Jourdain, A MeinertzhagenVolume:
245
Year:
1999
Language:
english
DOI:
10.1016/s0022-3093(98)00852-7
File:
PDF, 483 KB
english, 1999