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Nucleation and growth analysis of microcrystalline silicon by scanning probe microscopy: substrate dependence, local structural and electronic properties of as-grown surfaces
Ch Ross, J Herion, H WagnerVolume:
266-269
Year:
2000
Language:
english
DOI:
10.1016/s0022-3093(99)00736-x
File:
PDF, 361 KB
english, 2000