Effect of amorphous silicon material properties on the...

Effect of amorphous silicon material properties on the stability of thin film transistors: evidence for a local defect creation model

R.B. Wehrspohn, S.C. Deane, I.D. French, M.J. Powell
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Volume:
266-269
Year:
2000
Language:
english
DOI:
10.1016/s0022-3093(99)00777-2
File:
PDF, 127 KB
english, 2000
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