Electronic properties of microcrystalline silicon...

Electronic properties of microcrystalline silicon investigated by electron spin resonance and transport measurements

F Finger, J Müller, C Malten, R Carius, H Wagner
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Volume:
266-269
Year:
2000
Language:
english
DOI:
10.1016/s0022-3093(99)00802-9
File:
PDF, 338 KB
english, 2000
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