Electron spin resonance and optical characterization of...

Electron spin resonance and optical characterization of defects in microcrystalline silicon

M. Vaněček, A. Poruba, Z. Remeš, J. Rosa, S. Kamba, V. Vorlı́ček, J. Meier, A. Shah
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Volume:
266-269
Year:
2000
Language:
english
DOI:
10.1016/s0022-3093(99)00804-2
File:
PDF, 182 KB
english, 2000
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