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Electron spin resonance and optical characterization of defects in microcrystalline silicon
M. Vaněček, A. Poruba, Z. Remeš, J. Rosa, S. Kamba, V. Vorlı́ček, J. Meier, A. ShahVolume:
266-269
Year:
2000
Language:
english
DOI:
10.1016/s0022-3093(99)00804-2
File:
PDF, 182 KB
english, 2000