![](/img/cover-not-exists.png)
Modeling the dielectric functions of silicon-based films in the amorphous, nanocrystalline and microcrystalline regimes
A.S. Ferlauto, Joohyun Koh, P.I. Rovira, C.R. Wronski, R.W. Collins, Gautam GangulyVolume:
266-269
Year:
2000
Language:
english
DOI:
10.1016/s0022-3093(99)00834-0
File:
PDF, 238 KB
english, 2000