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Defect re-distribution in amorphous silicon below equilibration temperature
R.A.C.M.M van Swaaij, V Nádazdy, M Zeman, E Pincik, J.W MetselaarVolume:
266-269
Year:
2000
Language:
english
DOI:
10.1016/s0022-3093(99)00845-5
File:
PDF, 112 KB
english, 2000