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Mid-gap states measurements of low-level boron-doped a-Si:H films
Jeremy Theil, Dale Lefforge, Gerrit Kooi, Min Cao, Gary W RayVolume:
266-269
Year:
2000
Language:
english
DOI:
10.1016/s0022-3093(99)00847-9
File:
PDF, 149 KB
english, 2000