Dynamic force microscopy across steps on the Si(111)-(7×7) surface
M. Guggisberg, M. Bammerlin, A. Baratoff, R. Lüthi, Ch. Loppacher, F.M. Battiston, J. Lü, R. Bennewitz, E. Meyer, H.-J. GüntherodtVolume:
461
Year:
2000
Language:
english
DOI:
10.1016/s0039-6028(00)00592-6
File:
PDF, 519 KB
english, 2000